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콘텐츠 본문

논문 해외 국제전문학술지(SCI급)
Defect state and pattern analysis using the discretization state vectors
  • 2018
  • S. Baek, W. Baek, D. Kwon, D.-Y Kim
논문 해외 국제전문학술지(SCI급)
Abrupt variance and discernibility analyses of multi-sensor signals for fault pattern extraction
  • 2019
  • S. Baek, D.-Y Kim
논문 해외 국제전문학술지(SCI급)
Estimating system state through similarity analysis of signal patterns
  • 2020
  • K. Namgung, H. Yoon, S. Baek, D.-Y. Kim
논문 해외 국제전문학술지(SCI급)
A modular factory testbed for the rapid reconfiguration of manufacturing systems
  • 2020
  • D.-Y. Kim, J.-W. Park, S. Baek, K-B. Park, H.-R. Kim, J.-I. Park, H.-S. Kim, B.-B. Kim, H.-Y. Oh, K. Namgung, W. Baek