콘텐츠 본문
논문 해외 국제전문학술지(SCI급) Degradation analysis of doped organic p-n heterojunction charge generation layers by impedance and optical spectroscopy
- 학술지 구분 국제전문학술지(SCI급)
- 게재년월 2021-09
- 저자명 A. Gasonoo , Y.-J. Lim , E.-J. Jang , J. Lee , M.-H. Kim, Y. Choi , J.-H. Lee
- 학술지명 Materials Today Energy
- 발행처명 Science Direct
- 발행국가 해외
- 논문언어 외국어
- 전체저자수 7
논문 초록 (Abstract)
Investigation of the long-term stability of charge generation layers (CGLs) provides a fundamental and an essential approach in achieving highly efficient tandem organic electronic devices. Thus, in this foremost study, the degradation mechanism of electrically aged organic p-n heterojunction CGLs has been investigated by impedance and optical spectroscopy. Rubidium carbonate (Rb2CO3)edoped 2,2,2-(1,3,5- benzinetriyl)-tris(1-phenyl-1H-benzimidazole) (TPBi) and molybdenum trioxide (MoO3)edoped 1,4-bis [N-(1-naphthyl)-N0 -phenylamino]-4,40 -diamine (NPB) are used as the n-type and p-type organic semiconductors, respectively. A detailed analysis from capacitance-frequency (CeF) and capacitance-voltage (CeV) characteristics reveals reduced charge generation and 19.6% reduction in the geometric capacitance of the CGL after electrical aging. Reduced peak intensity from UVeViseNIR spectra of the aged CGL points to 21.4% charge transfer complex decomposition of the Rb2CO3-doped TPBi. We propose that the rate-limiting step of charge generation in the CGL is caused by the electron transport in the TPBi:Rb2CO3 layer and not the charge generation itself at the TPBi:Rb2CO3/NPB:MoO3 heterojunction. This simple, comprehensive, and non-destructive technique facilitates a crucial analysis that underpins the mechanism of device degradation and further provides a fundamental approach in developing highly stable CGLs for efficient organic electronic devices.
